Purchase of a new Field Emission Gun Scanning Electron Microscope with automated mineralogy analysis software

Geological Survey of Denmark and Greenland (GEUS)

GEUS wishes to buy a variable pressure field emission gun Scanning Electron Microscope that is suitable for reservoir studies, mining, and general geosciences applications. The instrument must contain automated mineralogy analysis software suitable for loose particulate material embedded in epoxy, as well as for the analysis of minerals surrounded by neighbouring grains in polished sections, and must hold Secondary Electrons, Back Scattered-contrast Electrons, Energy Dispersive Spectrometry, Electron Back-Scatter Diffraction and Cathodoluminescense detectors. The offer should include training, documentation, and furthermore maintenance and support for 5 years.

Deadline
Fristen for modtagelse af bud var på 2017-05-16. Indkøbet blev offentliggjort på 2017-04-07.

Leverandører
Følgende leverandører er nævnt i tildelingsbeslutninger eller andre indkøbsdokumenter:

• • Carl Zeiss A/S

Hvem?

• • Geological Survey of Denmark and Greenland (GEUS)

Hvad?

• • Elektronmikroskoper › Elektronrastermikroskoper

Hvor?

• • Hovedstaden › Byen København