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2018-01-16   Soft X-ray reflectometer for characterisation of thin film coatings (Technical University of Denmark / Danmarks Tekniske Universitet)
The contractor shall procure and commission a low-energy X-ray reflectometer facility, below 2 keV, in order to characterise and optimise thin film coatings for the Athena mission. The X-ray facility shall be installed in existing vacuum chamber. Se udbuddet »
Nævnte leverandører: JJ X-Ray